[10 Sep 2020] FSV: A Heuristic for Engineering Data Comparison – Prof. Alistair Duffy (President of the EMC-S)

Event Time

Prof. Alistair Duffy

Director of the Institute of Engineering Sciences and Professor of Electromagnetics, De Montfort University, Leicester, U.K

Abstract:
The FSV (Feature Selective Validation) method came out of the need to develop a way to robustly compare data from computational electromagnetic simulations against experimental data for the purpose of validation.  Typically, this data is composite and has an undulating envelope with many sharp, resonant-like, features. FSV is an approach that decomposes the original data into ‘envelope’ and ‘feature’ components and uses a weighted difference scheme to provide figures of merit to measure the dis-similarity of the data sets.  It has been shown that this approach provides a close analogue to the overall assessment provided by a group of engineers.  Further, the method has been extended to 2D (and nD) data with reasonable agreement being obtained using image mean opinion scores.  This talk will discuss the development, operation and future of the FSV method.

About the speaker:
Professor Alistair P. Duffy received the B.Eng. (Hons.) degree in electrical and electronic engineering and the M. Eng. degree from the University College, Cardiff, U.K., in 1988 and 1989, respectively. He received the Ph.D. degree from Nottingham University, Nottingham, U.K., in 1993 for his work on experimental validation of numerical modeling. He was awarded a DSc in 2019 from Cardiff University for his work on validation of computational electromagnetics.

He is currently Director of the Institute of Engineering Sciences and Professor of Electromagnetics at De Montfort University, Leicester, U.K.  He is also a Guest Professor at Harbin Institute of Technology, Harbin, China. He is the author of approximately 300 articles published in journals and presented at international symposia. His research interests include CEM validation, communications cabling, and technology management.

Dr. Duffy is a Fellow of the IEEE, the Institution of Engineering and Technology (IET) and the Royal Society for the Encouragement of Arts, Manufactures and Commerce (RSA).   He is President of the IEEE EMC Society.  He is an Associate Editor of the IEEE Transactions on EMC.

 

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