Abstract: This talk will touch upon ongoing research initiatives at Graz Technical University, focusing on crucial aspects of Electrostatic Discharge (ESD) phenomena in electronic systems, which includes 1) Understanding ESD Dynamics: The frequency and severity of ESD incidents are explored, shedding light on the occurrence patterns and the intensity of these disruptive events, laying the groundwork for robust ESD mitigation strategies. 2) System-level Efficient ESD Design: By emphasizing on the modeling and optimization of TVS diodes and their interaction with the internal protection mechanisms of ICs, efficient ESD design strategies are discussed. The strategies aim to enhance system reliability and resilience against ESD-induced damage. 3) Challenges in CDM (Charge Device Model) Measurement: As electronic devices continue to shrink and operational speeds increase, the characterization of Charge Device Model (CDM) events becomes increasingly challenging. To addresses these challenges, methodologies for accurately measuring CDM events at frequencies as high as 20 GHz are introduced, ensuring device robustness and compliance with industry standards.